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Automated Macro Semiconductor Wafer Defect Inspection Equipment Supplier | Testing
microtronicinc.xyzMicrotronic Inc. is a US-based manufacturer and supplier of semiconductor wafer inspection, testing, sorting, and metrology solutions. Its flagship product, Microtronic EAGLEview, is a market leading automated macro defect inspection system for semiconductor wafers.
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SEO audit: Content analysis
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| Title | Automated Macro Semiconductor Wafer Defect Inspection Equipment Supplier | Testing | ||||||||||||||||||||||||||||||||||||
| Text / HTML ratio | 32 % | ||||||||||||||||||||||||||||||||||||
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| Flash | Excellent! The website does not have any flash contents. | ||||||||||||||||||||||||||||||||||||
| Keywords cloud | – Defect Wafer Macro Microtronic EAGLEview wafer Defects defect inspection semiconductor Inspection MicroINSPECT macro systems equipment MicroSORT Spin automated Overview | ||||||||||||||||||||||||||||||||||||
| Keywords consistency |
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| Images | We found 42 images on this web page. |
SEO Keywords (Single)
| Keyword | Occurrence | Density |
|---|---|---|
| – | 29 | 1.45 % |
| Defect | 21 | 1.05 % |
| Wafer | 16 | 0.80 % |
| Macro | 15 | 0.75 % |
| Microtronic | 13 | 0.65 % |
| EAGLEview | 11 | 0.55 % |
| wafer | 10 | 0.50 % |
| Defects | 10 | 0.50 % |
| defect | 10 | 0.50 % |
| inspection | 9 | 0.45 % |
| semiconductor | 9 | 0.45 % |
| Inspection | 9 | 0.45 % |
| MicroINSPECT | 7 | 0.35 % |
| macro | 6 | 0.30 % |
| systems | 5 | 0.25 % |
| equipment | 5 | 0.25 % |
| MicroSORT | 4 | 0.20 % |
| Spin | 4 | 0.20 % |
| automated | 4 | 0.20 % |
| Overview | 4 | 0.20 % |
SEO Keywords (Two Word)
| Keyword | Occurrence | Density |
|---|---|---|
| Macro Defect | 8 | 0.40 % |
| macro defect | 6 | 0.30 % |
| semiconductor wafer | 5 | 0.25 % |
| Wafer Inspection | 5 | 0.25 % |
| wafer inspection | 5 | 0.25 % |
| inspection equipment | 4 | 0.20 % |
| automated macro | 4 | 0.20 % |
| Macro Defects | 4 | 0.20 % |
| defect inspection | 4 | 0.20 % |
| Defect Inspection | 4 | 0.20 % |
| defect semiconductor | 3 | 0.15 % |
| Failure Analysis | 3 | 0.15 % |
| – Failure | 3 | 0.15 % |
| Customized Solutions | 3 | 0.15 % |
| Microtronic Inc | 3 | 0.15 % |
| MicroINSPECT 300FA | 3 | 0.15 % |
| 300FA – | 3 | 0.15 % |
| Desktop Client | 3 | 0.15 % |
| ProcessGuard – | 3 | 0.15 % |
| – EAGLEview | 3 | 0.15 % |
SEO Keywords (Three Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| automated macro defect | 4 | 0.20 % | No |
| Software – Defect | 3 | 0.15 % | No |
| MicroINSPECT 300FA – | 3 | 0.15 % | No |
| Images and Sorting | 3 | 0.15 % | No |
| Sorter MicroINSPECT – | 3 | 0.15 % | No |
| MicroINSPECT – Microscope | 3 | 0.15 % | No |
| – Microscope Wafer | 3 | 0.15 % | No |
| Microscope Wafer Inspection | 3 | 0.15 % | No |
| Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
| Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| 300FA – Failure | 3 | 0.15 % | No |
| Stand Alone Wafer | 3 | 0.15 % | No |
| – Failure Analysis | 3 | 0.15 % | No |
| ProcessGuard – EAGLEview | 3 | 0.15 % | No |
| – EAGLEview Desktop | 3 | 0.15 % | No |
| EAGLEview Desktop Client | 3 | 0.15 % | No |
| SITEview Software – | 3 | 0.15 % | No |
| – Defect Review | 3 | 0.15 % | No |
| Defect Review Images | 3 | 0.15 % | No |
| Alone Wafer Sorter | 3 | 0.15 % | No |
SEO Keywords (Four Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| ProcessGuard – EAGLEview Desktop | 3 | 0.15 % | No |
| – Microscope Wafer Inspection | 3 | 0.15 % | No |
| – Stand Alone Wafer | 3 | 0.15 % | No |
| Stand Alone Wafer Sorter | 3 | 0.15 % | No |
| Alone Wafer Sorter MicroINSPECT | 3 | 0.15 % | No |
| Wafer Sorter MicroINSPECT – | 3 | 0.15 % | No |
| Sorter MicroINSPECT – Microscope | 3 | 0.15 % | No |
| MicroINSPECT – Microscope Wafer | 3 | 0.15 % | No |
| Microscope Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
| – EAGLEview Desktop Client | 3 | 0.15 % | No |
| Wafer Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| Inspection MicroINSPECT 300FA – | 3 | 0.15 % | No |
| MicroINSPECT 300FA – Failure | 3 | 0.15 % | No |
| 300FA – Failure Analysis | 3 | 0.15 % | No |
| – Defect Review Images | 3 | 0.15 % | No |
| Software – Defect Review | 3 | 0.15 % | No |
| SITEview Software – Defect | 3 | 0.15 % | No |
| MicroSORT – Stand Alone | 3 | 0.15 % | No |
| Defect Review Images and | 3 | 0.15 % | No |
| Review Images and Sorting | 3 | 0.15 % | No |
Internal links in - microtronicinc.xyz
Contact Us
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Site Map
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Company
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Microtronic Innovation Highlights
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Products
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
EAGLEview – Auto Macro Wafer Defect Inspection
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
MicroSORT – Stand Alone Wafer Sorter
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
MicroINSPECT – Microscope Wafer Inspection
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Customized Solutions
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
ProcessGuard – EAGLEview Desktop Client
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
SITEview Software – Defect Review, Images, and Sorting
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Technologies
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Applications
Semiconductor Wafer Defect Inspection Applications | Equipment
Semiconductor Wafer Defect Inspection Applications | Equipment
Defect Library
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
1-877-642-7687 1-508-627-8951
info {at} microtronic.com
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Arcing Defects
Arcing Semiconductor Wafer Macro Defect
Arcing Semiconductor Wafer Macro Defect
2 Chamber Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
3 Chamber Macro Defect
3 Chamber Semiconductor Macro Wafer Defect
3 Chamber Semiconductor Macro Wafer Defect
Backside Contamination
Semiconductor Backside Contamination Macro Defect
Semiconductor Backside Contamination Macro Defect
Poor Rinse – Macro Defect
Semiconductor Macro Defect | Insufficient Rinse
Semiconductor Macro Defect | Insufficient Rinse
Edge Chips – Macro Defects
Semiconductor Edge Chip Macro Defects
Semiconductor Edge Chip Macro Defects
CMP – Macro Defects
Semiconductor Wafer CMP Macro Defects
Semiconductor Wafer CMP Macro Defects
Wafer Contamination – Large
Semiconductor Wafer Contamination Macro Defects
Semiconductor Wafer Contamination Macro Defects
Wafer Contamination – Small
Semiconductor Wafer Small Contamination Macro Defect
Semiconductor Wafer Small Contamination Macro Defect
EBR Drip Defect
Semiconductor Wafer Edge Bead Macro Defect
Semiconductor Wafer Edge Bead Macro Defect
Developer Related Defects
Semiconductor Wafer Developer Macro Defect
Semiconductor Wafer Developer Macro Defect
Wafer Edge Discoloration
Semiconductor Wafer Edge Discoloration Macro Defect
Semiconductor Wafer Edge Discoloration Macro Defect
Flashfield Defects
Semiconductor Wafer Flashfield Macro Defect
Semiconductor Wafer Flashfield Macro Defect
First 12 Wafers – Different
Semiconductor Wafer Compared to Reference Wafer
Semiconductor Wafer Compared to Reference Wafer
Wafer Hotspot Defects
Wafer Hotspot Defects
Wafer Hotspot Defects
Lens Stepper Macro Defects
Lens Stepper Macro Defect
Lens Stepper Macro Defect
Missing Patterns
Missing Pattern Macro Defects
Missing Pattern Macro Defects
Particle Defects
Particle examples detected by EAGLEview
Particle examples detected by EAGLEview
Poly Haze Macro Defect
Poly Haze Macro Defect
Poly Haze Macro Defect
Partial Pattern – No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Microtronicinc.xyz Spined HTML
StreamlinedMacro Semiconductor Wafer Defect Inspection Equipment Supplier | Testing Home | Contact Us | Site Map HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect Library U.S. Manufacturer ofStreamlinedMacro Defect Semiconductor Wafer Inspection, Sorting, and Metrology Equipment EAGLEviewStreamlinedMacro Defect Inspection Solutions are Fast, Accurate, and Easy to Operate and Maintain. Established 1994 Microtronic, Inc. Overview Founded in 1994, Microtronic, Inc. is a U.S.-based, manufacturer and supplier of streamlined macro defect semiconductor wafer inspection equipment, semiconductor wafer sorters, and semiconductor metrology solutions. Our EAGLEview trademark of streamlined macro defect wafer inspection systems help semiconductor manufacturers and fab plants throughout the world subtract their time to market, optimize defect detection accuracy, and minimize production problems. Microtronic Provides Quicker ROI Microtronic's streamlined macro defect semiconductor wafer inspection equipment, sorters, and metrology tools are manufactured to support our clients' merchantry goals as well as their manufacturing processes. Our streamlined macro defect semiconductor wafer inspection equipment, wafer sorting systems, and related software and services unhook a quicker ROI by increasingly virtuously detecting defects at hair-trigger points in the semiconductor manufacturing process and at a much higher throughput. By detecting defects that other wafer defect inspection systems would normally miss -- and older in the production trundling -- you save time and money. Microtronic macro defect inspection tools and equipment go vastitude simple imaging and limited sampling of the semiconductor wafer to provide a well-constructed end-to-end process that automates the detection, categorization, and storage of defects identified and helps to map them to the specific production zone for enhanced root rationalization analysis. Leapfrog the Competition In today's fiercely competitive, unchangingly up-and-coming semiconductor market it's difficult to stay plane one step superiority of the competition. Microtronic EAGLEview macro defect inspection equipment, MicroSORT wafer sorting systems, and MicroINSPECT systems, together with Microtronic defect inspection software helps you get not just one step superiority -- but leapfrog the competition. Contact Us Today Microtronic understands collaborating with our customers will unchangingly unhook the weightier results. So contact us today and let's explore -- together -- how we can implement a "zero defect" wafer inspection strategy for your production environment. Microtronic Product Gallery CONTACT US 1-877-642-7687 1-508-627-8951 info {at} microtronic.com Microtronic Overview Video Microtronic EAGLEview Video Gallery of Macro Defects Detected By EAGLEview Arcing Defects 2 Chamber Macro Defect 3 Chamber Macro Defect Backside Contamination Blocked Etch Macro Defect Poor Rinse – Macro Defect Edge Chips – Macro Defects CMP – Macro Defects Wafer Contamination – Large Wafer Contamination – Small EBR Drip Defect Developer Related Defects Wafer Edge Discoloration Flashfield Defects First 12 Wafers – Different Wafer Hotspot Defects Lens Stepper Macro Defects Missing Patterns Particle Defects Poly Haze Macro Defect Partial Pattern – No Expose Previous Layer Defects Rework – Scrap Avoidance Rework – Yield Improvement Scratches By Human Scratches By Machine Center Spin Macro Defect Spin Defect on Edge Spin Defect – Entire Wafer Spin Defect – Line Reticle Tilt Defect Semiconductor Wafer Inspection ProductsEAGLEview – Auto Macro Wafer Defect Inspection ProcessGuard – EAGLEview Desktop Client MicroSORT – Stand Alone Wafer Sorter MicroINSPECT – Microscope Wafer Inspection MicroINSPECT 300FA – FailureWringerSITEview Software – Defect Review, Images, and Sorting Customized Solutions HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect LibraryPrivacyTerms of UseSite Map © Copyright Microtronic Inc. All Rights Reserved 1994 - 2018 Website by LPR Global, Inc. www.lprglobal.com