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Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
microtronicinc.xyzMicrotronic, is a Hawthorne, NY-based company founded in 1994 that designs, manufacturers, and markets advanced automated semiconductor wafer defect inspection tools, equipment and software to semiconductor manufacturers globally. Microtronic products are manufactured in the USA.
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SEO audit: Content analysis
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| Title | Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems | ||||||||||||||||||||||||||||||||||||
| Text / HTML ratio | 34 % | ||||||||||||||||||||||||||||||||||||
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| Flash | Excellent! The website does not have any flash contents. | ||||||||||||||||||||||||||||||||||||
| Keywords cloud | – Defect Wafer Microtronic Macro Inspection semiconductor Defects inspection EAGLEview defect MicroINSPECT wafer Sorting Company Software Review SITEview solutions | ||||||||||||||||||||||||||||||||||||
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| Images | We found 40 images on this web page. |
SEO Keywords (Single)
| Keyword | Occurrence | Density |
|---|---|---|
| – | 36 | 1.80 % |
| Defect | 24 | 1.20 % |
| Wafer | 21 | 1.05 % |
| Microtronic | 19 | 0.95 % |
| Macro | 15 | 0.75 % |
| Inspection | 14 | 0.70 % |
| semiconductor | 13 | 0.65 % |
| Defects | 10 | 0.50 % |
| inspection | 10 | 0.50 % |
| EAGLEview | 10 | 0.50 % |
| defect | 9 | 0.45 % |
| MicroINSPECT | 8 | 0.40 % |
| wafer | 8 | 0.40 % |
| 7 | 0.35 % | |
| Sorting | 6 | 0.30 % |
| Company | 6 | 0.30 % |
| Software | 6 | 0.30 % |
| Review | 5 | 0.25 % |
| SITEview | 5 | 0.25 % |
| solutions | 5 | 0.25 % |
SEO Keywords (Two Word)
| Keyword | Occurrence | Density |
|---|---|---|
| Macro Defect | 8 | 0.40 % |
| defect inspection | 8 | 0.40 % |
| Wafer Inspection | 7 | 0.35 % |
| Defect Inspection | 6 | 0.30 % |
| Defect Review | 5 | 0.25 % |
| semiconductor wafer | 5 | 0.25 % |
| wafer sorters | 4 | 0.20 % |
| Auto Macro | 4 | 0.20 % |
| MicroINSPECT – | 4 | 0.20 % |
| and Sorting | 4 | 0.20 % |
| – Microscope | 4 | 0.20 % |
| Wafer Defect | 4 | 0.20 % |
| Microscope Wafer | 4 | 0.20 % |
| Macro Defects | 4 | 0.20 % |
| – Defect | 4 | 0.20 % |
| SITEview Software | 4 | 0.20 % |
| MicroINSPECT 300FA | 4 | 0.20 % |
| 300FA – | 4 | 0.20 % |
| Desktop Client | 4 | 0.20 % |
| Microtronic Inc | 4 | 0.20 % |
SEO Keywords (Three Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| MicroINSPECT 300FA – | 4 | 0.20 % | No |
| – Defect Review | 4 | 0.20 % | No |
| Wafer Defect Inspection | 4 | 0.20 % | No |
| MicroINSPECT – Microscope | 4 | 0.20 % | No |
| – Microscope Wafer | 4 | 0.20 % | No |
| Microscope Wafer Inspection | 4 | 0.20 % | No |
| Review Images and | 3 | 0.15 % | No |
| Images and Sorting | 3 | 0.15 % | No |
| Sorter MicroINSPECT – | 3 | 0.15 % | No |
| Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
| Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| 300FA – Failure | 3 | 0.15 % | No |
| Stand Alone Wafer | 3 | 0.15 % | No |
| – Failure Analysis | 3 | 0.15 % | No |
| ProcessGuard – EAGLEview | 3 | 0.15 % | No |
| – EAGLEview Desktop | 3 | 0.15 % | No |
| EAGLEview Desktop Client | 3 | 0.15 % | No |
| SITEview Software – | 3 | 0.15 % | No |
| Software – Defect | 3 | 0.15 % | No |
| Defect Review Images | 3 | 0.15 % | No |
SEO Keywords (Four Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| – Microscope Wafer Inspection | 4 | 0.20 % | No |
| MicroINSPECT – Microscope Wafer | 4 | 0.20 % | No |
| Review Images and Sorting | 3 | 0.15 % | No |
| MicroSORT – Stand Alone | 3 | 0.15 % | No |
| – EAGLEview Desktop Client | 3 | 0.15 % | No |
| 300FA – Failure Analysis | 3 | 0.15 % | No |
| MicroINSPECT 300FA – Failure | 3 | 0.15 % | No |
| Inspection MicroINSPECT 300FA – | 3 | 0.15 % | No |
| Wafer Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| Microscope Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
| Sorter MicroINSPECT – Microscope | 3 | 0.15 % | No |
| Wafer Sorter MicroINSPECT – | 3 | 0.15 % | No |
| Alone Wafer Sorter MicroINSPECT | 3 | 0.15 % | No |
| Stand Alone Wafer Sorter | 3 | 0.15 % | No |
| – Stand Alone Wafer | 3 | 0.15 % | No |
| ProcessGuard – EAGLEview Desktop | 3 | 0.15 % | No |
| Macro Wafer Defect Inspection | 3 | 0.15 % | No |
| Products EAGLEview – Auto | 3 | 0.15 % | No |
| Defect Review Images and | 3 | 0.15 % | No |
| – Defect Review Images | 3 | 0.15 % | No |
Internal links in - microtronicinc.xyz
Contact Us
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Site Map
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Company
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Microtronic Innovation Highlights
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Products
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
EAGLEview – Auto Macro Wafer Defect Inspection
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
MicroSORT – Stand Alone Wafer Sorter
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
MicroINSPECT – Microscope Wafer Inspection
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Customized Solutions
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
ProcessGuard – EAGLEview Desktop Client
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
SITEview Software – Defect Review, Images, and Sorting
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Technologies
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Applications
Semiconductor Wafer Defect Inspection Applications | Equipment
Semiconductor Wafer Defect Inspection Applications | Equipment
Defect Library
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
1-877-642-7687 1-508-627-8951
info {at} microtronic.com
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Arcing Defects
Arcing Semiconductor Wafer Macro Defect
Arcing Semiconductor Wafer Macro Defect
2 Chamber Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
3 Chamber Macro Defect
3 Chamber Semiconductor Macro Wafer Defect
3 Chamber Semiconductor Macro Wafer Defect
Backside Contamination
Semiconductor Backside Contamination Macro Defect
Semiconductor Backside Contamination Macro Defect
Poor Rinse – Macro Defect
Semiconductor Macro Defect | Insufficient Rinse
Semiconductor Macro Defect | Insufficient Rinse
Edge Chips – Macro Defects
Semiconductor Edge Chip Macro Defects
Semiconductor Edge Chip Macro Defects
CMP – Macro Defects
Semiconductor Wafer CMP Macro Defects
Semiconductor Wafer CMP Macro Defects
Wafer Contamination – Large
Semiconductor Wafer Contamination Macro Defects
Semiconductor Wafer Contamination Macro Defects
Wafer Contamination – Small
Semiconductor Wafer Small Contamination Macro Defect
Semiconductor Wafer Small Contamination Macro Defect
EBR Drip Defect
Semiconductor Wafer Edge Bead Macro Defect
Semiconductor Wafer Edge Bead Macro Defect
Developer Related Defects
Semiconductor Wafer Developer Macro Defect
Semiconductor Wafer Developer Macro Defect
Wafer Edge Discoloration
Semiconductor Wafer Edge Discoloration Macro Defect
Semiconductor Wafer Edge Discoloration Macro Defect
Flashfield Defects
Semiconductor Wafer Flashfield Macro Defect
Semiconductor Wafer Flashfield Macro Defect
First 12 Wafers – Different
Semiconductor Wafer Compared to Reference Wafer
Semiconductor Wafer Compared to Reference Wafer
Wafer Hotspot Defects
Wafer Hotspot Defects
Wafer Hotspot Defects
Lens Stepper Macro Defects
Lens Stepper Macro Defect
Lens Stepper Macro Defect
Missing Patterns
Missing Pattern Macro Defects
Missing Pattern Macro Defects
Particle Defects
Particle examples detected by EAGLEview
Particle examples detected by EAGLEview
Poly Haze Macro Defect
Poly Haze Macro Defect
Poly Haze Macro Defect
Partial Pattern – No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Microtronicinc.xyz Spined HTML
VisitorOverview | ManufacturerWheelsMacro Defect Wafer Inspection Systems Home | Contact Us | Site Map HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview –WheelsMacro Wafer Defect InspectionMicroSORT – StandVacatedWafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect Library Home »Visitor»VisitorOverview Microtronic is a Classic High-Tech Entrepreneurial Story of Innovation "Our goal is to build the fastest, most accurate, and easiest-to-use semiconductor wafer inspection solutions for our customers" Reiner Fenske, Founder Microtronic is a Leader in Semiconductor Wafer Defect Inspection, Sorting and Metrology Founded in 1994, Microtronic, Inc. is a US-based visitor that designs, manufacturers, and markets streamlined semiconductor wafer defect inspection equipment, semiconductor wafer sorters, and semiconductor metrology tools and equipment to semiconductor manufacturers, fabrication plants and device manufacturers throughout the world. Microtronic is headquartered in Hawthorne, New York, well-nigh 30 minutes north of Manhattan. Microtronic solutions are manufactured in the USA. Early Beginnings |WideWafer Inspection MicroscopesWithoutidentifying a need for largest automation, imaging, accuracy, and throughput in the rapidly evolving semiconductor manufacturing market, Microtronic’s President, Reiner Fenske, founded Microtronic without a successful career with Zeiss Semiconductor. High Throughput Wafer Inspection Initially Microtronic designed new robotics applications and software that streamlined and enhanced the speed of wafer defect inspection packaged in an extremely user-friendly inspection environment. These early streamlined systems were an firsthand success with Tier-1 semiconductor manufacturers and remain the foundation of Microtronic’s transferral to the semiconductor wafer defect inspection market. Innovation, Growth & Recognition In a few short years Microtronic personal many of the names on the Top 20 list of the largest semiconductor manufacturers as clients for its wide microscopes, defect inspection software, semiconductor wafer sorters and streamlined macro defect inspection equipment. Its total transferral to consumer satisfaction and overall quality earned it many accolades including: Lucent Technologies Vendor of the Year Award in 2000, 2001 Texas Instruments Supplier Excellence Award 2006 Today – Complete Integrated Product Line ofWheelsMacro Defect Inspection Equipment, Sorters, Metrology EAGLEview Inspects Each and Every Wafer and Stores a Full Color Wafer Image Microtronic continues its transferral to developing market leading integrated macro defect inspection equipment, wafer sorters, and metrology solutions for the semiconductor manufacturing market. Today, all of our products offer superior investment protection and ROI by providing integrated solutions that are modular so you can still goody from stand vacated solutions when your using calls for it. This offers our clients a flexible, cost-effective upgrade path when new requirements can still be met with existing equipment that can be hands extended to meet new needs. Microtronic SITEview Software integrates with Microtronic wheels macro defect inspection tools, wafer sorters, robots, and microscopes to offer clients a increasingly flexible tideway to defect inspection. You buy what you need. We strive to grow with our customers’ needs and maximize their ROI and forfeit of ownership of all equipment purchases. Our major branded products include: EAGLEview –StreamlinedMacro Defect Inspection System ProcessGUARD – DesktopVendeefor EAGLEview Inspection Management SITEview – Defect Review, Image Storage & Retrieval and Sorting Software MicroSORT – StandVacatedSorting System MicroINSPECT – Microscope Wafer Inspection Systems MicroINSPECT 300FA – 200mm / 300mm Bridge Tool for Defect Review EAGLEimage – Image Acquisition Software Facilities and Operations Microtronic, Inc. serves a global vendee wiring of semiconductor manufactures, foundries, IDMs, and fabrication plants. Our primary R&D and operations are hosted at our Hawthorne, NY facility and we have sales, consumer service and field engineering located geographically in areas that weightier serve our clients. These locations include Texas, Florida, Massachusetts, California and Seoul, South Korea. How Can We Help You Today? Give us a undeniability and speak with one of our consulting engineers to see how Microtronic can help write your semiconductor defect inspection requirements. (c) Copyright Microtronic, Inc. 1994-2014 All Rights Reserved CONTACT US 1-877-642-7687 1-508-627-8951 info {at} microtronic.com Microtronic Overview Video Microtronic EAGLEview Video Gallery of Macro Defects Detected By EAGLEview Arcing Defects 2 Chamber Macro Defect 3 Chamber Macro Defect Backside Contamination Blocked Etch Macro Defect Poor Rinse – Macro Defect Edge Chips – Macro Defects CMP – Macro Defects Wafer Contamination – Large Wafer Contamination – Small EBR Drip Defect Developer Related Defects Wafer Edge Discoloration Flashfield Defects First 12 Wafers – Different Wafer Hotspot Defects Lens Stepper Macro Defects Missing Patterns Particle Defects Poly Haze Macro Defect Partial Pattern – No Expose Previous Layer Defects Rework – Scrap Avoidance Rework – Yield Improvement Scratches By Human Scratches By Machine Center Spin Macro Defect Spin Defect on Edge Spin Defect – Entire Wafer Spin Defect – Line Reticle Tilt Defect Semiconductor Wafer Inspection ProductsEAGLEview –WheelsMacro Wafer Defect Inspection ProcessGuard – EAGLEview DesktopVendeeMicroSORT – StandVacatedWafer Sorter MicroINSPECT – Microscope Wafer Inspection MicroINSPECT 300FA – Failure Analysis SITEview Software – Defect Review, Images, and Sorting Customized Solutions HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview –WheelsMacro Wafer Defect InspectionMicroSORT – StandVacatedWafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect LibraryPrivacyTerms of UseSite Map © Copyright Microtronic Inc. 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