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Semiconductor Edge Chip Macro Defects

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SemiconductorWhetChip Macro Defects Home | Contact Us | Site Map HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect Library Home »WhetChips – Macro Defects Semiconductor Wafer Defects LibraryWhetChips – Macro Defects Return to Macro Defect Library Above is an example of a semiconductor wafer whet tweedle defect detected by EAGLEview.  Note that a white whirligig virtually the semiconductor wafer indicates that an whet defect may have been detected.  The semiconductor wafer whet ribbon will moreover indicate the wafer defect location based on 360 degrees with the unappetizing or notch at 0 degrees.  EAGLEview makes it easy to visualize and unmistakably see where the wafer defect resides. On the far right side of the semiconductor wafer is an whet tweedle defect.  Microtronic’s EAGLEview system’s measuring tool indicates that this semiconductor wafer whet tweedle defect is well-nigh 9mm long. Additional examples of semiconductor wafer whet chip  defects detected by EAGLEview. CONTACT US 1-877-642-7687 1-508-627-8951 info {at} microtronic.com Microtronic Overview Video Microtronic EAGLEview Video Gallery of Macro Defects Detected By EAGLEview Arcing Defects 2 Chamber Macro Defect 3 Chamber Macro Defect Backside Contamination Blocked Etch Macro Defect Poor Rinse – Macro DefectWhetChips – Macro Defects CMP – Macro Defects Wafer Contamination – Large Wafer Contamination – Small EBR Drip Defect Developer Related Defects WaferWhetDiscoloration Flashfield Defects First 12 Wafers – Different Wafer Hotspot Defects Lens Stepper Macro Defects Missing Patterns Particle Defects Poly Haze Macro Defect Partial Pattern – No Expose Previous Layer Defects Rework – Scrap Avoidance Rework – Yield Improvement Scratches By Human Scratches By Machine Center Spin Macro Defect Spin Defect onWhetSpin Defect – Entire Wafer Spin Defect – Line Reticle Tilt Defect Semiconductor Wafer Inspection ProductsEAGLEview – Auto Macro Wafer Defect Inspection ProcessGuard – EAGLEview Desktop Client MicroSORT – Stand Alone Wafer Sorter MicroINSPECT – Microscope Wafer Inspection MicroINSPECT 300FA – Failure Analysis SITEview Software – Defect Review, Images, and Sorting Customized Solutions HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect LibraryPrivacyTerms of UseSite Map © Copyright Microtronic Inc. All Rights Reserved 1994 - 2018 Website by LPR Global, Inc. www.lprglobal.com