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StreamlinedMacro Defect Semiconductor Wafer Inspection Equipment Home | Contact Us | Site Map HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect Library Home » Products » EAGLEview – Auto Macro Wafer Defect InspectionStreamlinedMacro Defect Inspection Equipment for Semiconductor Wafers | Manufacturer EagleVIEWStreamlinedMacro Defect Wafer Inspection Equipment and Related Software Provides Unrivaled Speed,Verismand Reliability EAGLEview streamlined macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer nomenclature for semiconductor manufacturing. EAGLEview systems have inspected over 100 million semiconductor wafers worldwide. The EAGLEview macro defect inspection tool resolves many of the problems and pitfalls of transmission and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating well-constructed images of every wafer in the cassette. Unlike transmission micro defect wafer inspection, EAGLEview's streamlined wafer inspection is unchangingly consistent, tireless, reliable, and fast. EAGLEvierw helps find macro defects while there's still time to take touching-up action. EAGLEview provides streamlined macro defect detection, excursion tenancy and wafer randomization delivering resulting and reliable results while seamlessly integrating into your existing semiconductor manufacturing environment. EAGLEview combines incredible macro defect inspection throughput with state-of-the art software and analytics in an ergonomic, easy-to-use versatile platform. Operators can automatically and quickly inspect semiconductor wafers from 50mm to 450mm at a rate of over 3,000 wafers per day. EAGLEview configures quickly without complicated and time consuming recipe minutiae and recipe maintenance. Contact us today to learn how Microtronic EAGLEview macro inspection systems can enhance your productivity. EAGLEviewStreamlinedMacro Defect Semiconductor Wafer Inspection Equipment EAGLEview Auto Macro Semiconductor Wafer Defect Inspection PDF EAGLEviewStreamlinedMacro Semiconductor Wafer Defect Inspection Equipment EAGLEview macro defect semiconductor wafer inspection systems combine state-of-the-art robotics, imaging, Microtronic ProcessGuard software, and analytics to provide an unparalleled wafer inspection solution for 50 mm to 300 mm wafers at a rate of 3,000 wafers per day. EAGLEview systems have inspected over 100 million wafers worldwide.   Each wafer is completely imaged and stored as a full-sized wafer image at any step throughout the manufacturing process.  Historical data and images are hands correlated to any point in the production process to help perform root rationalization wringer and take touching-up whoopee at the primeval possible time.  It’s faster, increasingly accurate, and easier to operate than typical transmission inspection. EAGLEview Macro Defect Wafer Detection System Can Inspect 50mm to 450mm Wafers EAGLEview Macro Defect Inspection System | Key Features & Benefits High Speed Throughput — 3,000 wafers per day Detects Macro Defects –Hotspots, missing patterns, spin defects, scratches, etc. No Device Dependent Recipes Required! 1-4 Cassettes Wafer Randomization — Eliminates separate sorter step Massive Sampling –inspect each and every wafer in the cassette ExcursionTenancy& Yield Improvement Scrap Avoidance RootRationalizationAnalysis Pareto graphing Guardbanding— Electronically ink-off defects as region or die based file Database Server — 2 years of historical images and dataWell-constructedDocumentation:  Full Wafer Images, Defect List, Wafer Defect Maps, Wafer Tracking Review Thumbnail images and full wafer images quickly Weigh Cell Monitor— Measure Wafer Weight During Macro Scan ReducesTransmissionInspection Staffing KLARF defect file format Integrates with Microtronic MicroINSPECT and MicroSORT EAGLEview Auto Macro Wafer Defect Inspection – SMIF                       Copyright 1994-2014 Microtronic, Inc. All Rights Reserved.StreamlinedMacro Defect Semiconductor Wafer Inspection Equipment CONTACT US 1-877-642-7687 1-508-627-8951 info {at} microtronic.com Microtronic Overview Video Microtronic EAGLEview Video Gallery of Macro Defects Detected By EAGLEview Arcing Defects 2 Chamber Macro Defect 3 Chamber Macro Defect Backside Contamination Blocked Etch Macro Defect Poor Rinse – Macro Defect Edge Chips – Macro Defects CMP – Macro Defects Wafer Contamination – Large Wafer Contamination – Small EBR Drip Defect Developer Related Defects Wafer Edge Discoloration Flashfield Defects First 12 Wafers – Different Wafer Hotspot Defects Lens Stepper Macro Defects Missing Patterns Particle Defects Poly Haze Macro Defect Partial Pattern – No Expose Previous Layer Defects Rework – Scrap Avoidance Rework – Yield Improvement Scratches By Human Scratches By Machine Center Spin Macro Defect Spin Defect on Edge Spin Defect – Entire Wafer Spin Defect – Line Reticle Tilt Defect Semiconductor Wafer Inspection ProductsEAGLEview – Auto Macro Wafer Defect Inspection ProcessGuard – EAGLEview Desktop Client MicroSORT – Stand Alone Wafer Sorter MicroINSPECT – Microscope Wafer Inspection MicroINSPECT 300FA – FailureWringerSITEview Software – Defect Review, Images, and Sorting Customized Solutions HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect LibraryPrivacyTerms of UseSite Map © Copyright Microtronic Inc. 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