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Semiconductor Wafer Edge Discoloration Macro Defect
microtronicinc.xyzMicrotronic's EagleVIEW auto macro semiconductor defect inspection system increases yield by detecting, containing and preventing macro defects in your production process within the fab and across the enterprise.
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SEO audit: Content analysis
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Title | Semiconductor Wafer Edge Discoloration Macro Defect | ||||||||||||||||||||||||||||||||||||
Text / HTML ratio | 29 % | ||||||||||||||||||||||||||||||||||||
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Flash | Excellent! The website does not have any flash contents. | ||||||||||||||||||||||||||||||||||||
Keywords cloud | – Defect Wafer Macro Defects EAGLEview Inspection wafer MicroINSPECT Edge Microtronic discoloration Library macro edge Spin semiconductor Home Company Software | ||||||||||||||||||||||||||||||||||||
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Images | We found 39 images on this web page. |
SEO Keywords (Single)
Keyword | Occurrence | Density |
---|---|---|
– | 29 | 1.45 % |
Defect | 20 | 1.00 % |
Wafer | 18 | 0.90 % |
Macro | 14 | 0.70 % |
Defects | 11 | 0.55 % |
EAGLEview | 10 | 0.50 % |
Inspection | 7 | 0.35 % |
wafer | 6 | 0.30 % |
MicroINSPECT | 6 | 0.30 % |
Edge | 5 | 0.25 % |
Microtronic | 5 | 0.25 % |
discoloration | 4 | 0.20 % |
Library | 4 | 0.20 % |
macro | 4 | 0.20 % |
edge | 4 | 0.20 % |
Spin | 4 | 0.20 % |
semiconductor | 4 | 0.20 % |
Home | 4 | 0.20 % |
Company | 4 | 0.20 % |
Software | 3 | 0.15 % |
SEO Keywords (Two Word)
Keyword | Occurrence | Density |
---|---|---|
Macro Defect | 7 | 0.35 % |
Wafer Inspection | 4 | 0.20 % |
edge of | 4 | 0.20 % |
the edge | 4 | 0.20 % |
semiconductor wafer | 4 | 0.20 % |
Macro Defects | 4 | 0.20 % |
– EAGLEview | 3 | 0.15 % |
Inspection MicroINSPECT | 3 | 0.15 % |
MicroINSPECT 300FA | 3 | 0.15 % |
300FA – | 3 | 0.15 % |
– Failure | 3 | 0.15 % |
Failure Analysis | 3 | 0.15 % |
Spin Defect | 3 | 0.15 % |
Customized Solutions | 3 | 0.15 % |
ProcessGuard – | 3 | 0.15 % |
– Defect | 3 | 0.15 % |
EAGLEview Desktop | 3 | 0.15 % |
Desktop Client | 3 | 0.15 % |
Microscope Wafer | 3 | 0.15 % |
Software – | 3 | 0.15 % |
SEO Keywords (Three Word)
Keyword | Occurrence | Density | Possible Spam |
---|---|---|---|
the edge of | 4 | 0.20 % | No |
Software – Defect | 3 | 0.15 % | No |
MicroINSPECT 300FA – | 3 | 0.15 % | No |
Images and Sorting | 3 | 0.15 % | No |
Sorter MicroINSPECT – | 3 | 0.15 % | No |
MicroINSPECT – Microscope | 3 | 0.15 % | No |
– Microscope Wafer | 3 | 0.15 % | No |
Microscope Wafer Inspection | 3 | 0.15 % | No |
Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
300FA – Failure | 3 | 0.15 % | No |
Stand Alone Wafer | 3 | 0.15 % | No |
– Failure Analysis | 3 | 0.15 % | No |
ProcessGuard – EAGLEview | 3 | 0.15 % | No |
– EAGLEview Desktop | 3 | 0.15 % | No |
EAGLEview Desktop Client | 3 | 0.15 % | No |
SITEview Software – | 3 | 0.15 % | No |
– Defect Review | 3 | 0.15 % | No |
Defect Review Images | 3 | 0.15 % | No |
Alone Wafer Sorter | 3 | 0.15 % | No |
SEO Keywords (Four Word)
Keyword | Occurrence | Density | Possible Spam |
---|---|---|---|
ProcessGuard – EAGLEview Desktop | 3 | 0.15 % | No |
– Microscope Wafer Inspection | 3 | 0.15 % | No |
– Stand Alone Wafer | 3 | 0.15 % | No |
Stand Alone Wafer Sorter | 3 | 0.15 % | No |
Alone Wafer Sorter MicroINSPECT | 3 | 0.15 % | No |
Wafer Sorter MicroINSPECT – | 3 | 0.15 % | No |
Sorter MicroINSPECT – Microscope | 3 | 0.15 % | No |
MicroINSPECT – Microscope Wafer | 3 | 0.15 % | No |
Microscope Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
– EAGLEview Desktop Client | 3 | 0.15 % | No |
Wafer Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
Inspection MicroINSPECT 300FA – | 3 | 0.15 % | No |
MicroINSPECT 300FA – Failure | 3 | 0.15 % | No |
300FA – Failure Analysis | 3 | 0.15 % | No |
Software – Defect Review | 3 | 0.15 % | No |
SITEview Software – Defect | 3 | 0.15 % | No |
the edge of the | 3 | 0.15 % | No |
MicroSORT – Stand Alone | 3 | 0.15 % | No |
– Defect Review Images | 3 | 0.15 % | No |
Defect Review Images and | 3 | 0.15 % | No |
Internal links in - microtronicinc.xyz
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
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Microtronicinc.xyz Spined HTML
Semiconductor WaferWhetDiscoloration Macro Defect Home | Contact Us | Site Map HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect Library Home » WaferWhetDiscoloration Semiconductor Wafer Defects Library WaferWhetDiscoloration Return to Macro Defect Library EAGLEview image of a semiconductor wafer with a discoloration macro defect on the whet of the wafer Above is an example of a semiconductor wafer macro defect detected near the whet of wafer identified as discoloration. Image taken by EAGLEvview of a large discoloration macro defect on the whet of the semiconductor wafer EAGLEview detects a variety of macro defects near the whet of the semiconductor wafer including discoloration. CONTACT US 1-877-642-7687 1-508-627-8951 info {at} microtronic.com Microtronic Overview Video Microtronic EAGLEview Video Gallery of Macro Defects Detected By EAGLEview Arcing Defects 2 Chamber Macro Defect 3 Chamber Macro Defect Backside Contamination Blocked Etch Macro Defect Poor Rinse – Macro DefectWhetChips – Macro Defects CMP – Macro Defects Wafer Contamination – Large Wafer Contamination – Small EBR Drip Defect Developer Related Defects WaferWhetDiscoloration Flashfield Defects First 12 Wafers – Different Wafer Hotspot Defects Lens Stepper Macro Defects Missing Patterns Particle Defects Poly Haze Macro Defect Partial Pattern – No Expose Previous Layer Defects Rework – Scrap Avoidance Rework – Yield Improvement Scratches By Human Scratches By Machine Center Spin Macro Defect Spin Defect onWhetSpin Defect – Entire Wafer Spin Defect – Line Reticle Tilt Defect Semiconductor Wafer Inspection ProductsEAGLEview – Auto Macro Wafer Defect Inspection ProcessGuard – EAGLEview Desktop Client MicroSORT – Stand Alone Wafer Sorter MicroINSPECT – Microscope Wafer Inspection MicroINSPECT 300FA – Failure Analysis SITEview Software – Defect Review, Images, and Sorting Customized Solutions HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect LibraryPrivacyTerms of UseSite Map © Copyright Microtronic Inc. All Rights Reserved 1994 - 2018 Website by LPR Global, Inc. www.lprglobal.com