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Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
microtronicinc.xyzMicrotronic is a Hawthorne, NY-based manufacturer and supplier of semiconductor wafer inspection systems, semiconductor sorters and metrology solutions to the semiconductor manufacturing market throughout the world. | Microtronic Inc.
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SEO audit: Content analysis
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| Title | Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment | ||||||||||||||||||||||||||||||||||||
| Text / HTML ratio | 34 % | ||||||||||||||||||||||||||||||||||||
| Frame | Excellent! The website does not use iFrame solutions. | ||||||||||||||||||||||||||||||||||||
| Flash | Excellent! The website does not have any flash contents. | ||||||||||||||||||||||||||||||||||||
| Keywords cloud | – Defect Wafer Inspection MicroINSPECT inspection wafer Macro SITEview Defects Microscope Semiconductor Software EAGLEview System Microtronic semiconductor microscope Review defect | ||||||||||||||||||||||||||||||||||||
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| Images | We found 38 images on this web page. |
SEO Keywords (Single)
| Keyword | Occurrence | Density |
|---|---|---|
| – | 32 | 1.60 % |
| Defect | 27 | 1.35 % |
| Wafer | 25 | 1.25 % |
| Inspection | 21 | 1.05 % |
| MicroINSPECT | 19 | 0.95 % |
| inspection | 17 | 0.85 % |
| wafer | 16 | 0.80 % |
| Macro | 15 | 0.75 % |
| SITEview | 15 | 0.75 % |
| Defects | 10 | 0.50 % |
| Microscope | 9 | 0.45 % |
| Semiconductor | 9 | 0.45 % |
| Software | 9 | 0.45 % |
| EAGLEview | 9 | 0.45 % |
| System | 8 | 0.40 % |
| Microtronic | 7 | 0.35 % |
| semiconductor | 7 | 0.35 % |
| microscope | 5 | 0.25 % |
| Review | 5 | 0.25 % |
| defect | 4 | 0.20 % |
SEO Keywords (Two Word)
| Keyword | Occurrence | Density |
|---|---|---|
| Semiconductor Wafer | 9 | 0.45 % |
| Wafer Inspection | 9 | 0.45 % |
| Macro Defect | 8 | 0.40 % |
| SITEview Software | 8 | 0.40 % |
| Defect Inspection | 8 | 0.40 % |
| Inspection System | 8 | 0.40 % |
| Wafer Defect | 7 | 0.35 % |
| wafer inspection | 6 | 0.30 % |
| MicroINSPECT Semiconductor | 6 | 0.30 % |
| Inspection MicroINSPECT | 5 | 0.25 % |
| semiconductor wafer | 5 | 0.25 % |
| Microscope Wafer | 4 | 0.20 % |
| Defect Review | 4 | 0.20 % |
| – Microscope | 4 | 0.20 % |
| MicroINSPECT – | 4 | 0.20 % |
| Failure Analysis | 4 | 0.20 % |
| Macro Defects | 4 | 0.20 % |
| defect inspection | 3 | 0.15 % |
| – EAGLEview | 3 | 0.15 % |
| Customized Solutions | 3 | 0.15 % |
SEO Keywords (Three Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| MicroINSPECT Semiconductor Wafer | 6 | 0.30 % | No |
| Wafer Defect Inspection | 6 | 0.30 % | No |
| Semiconductor Wafer Inspection | 5 | 0.25 % | No |
| Microscope Wafer Inspection | 4 | 0.20 % | No |
| Wafer Inspection MicroINSPECT | 4 | 0.20 % | No |
| – Microscope Wafer | 4 | 0.20 % | No |
| MicroINSPECT – Microscope | 4 | 0.20 % | No |
| Defect Inspection System | 3 | 0.15 % | No |
| MicroSORT – Stand | 3 | 0.15 % | No |
| ProcessGuard – EAGLEview | 3 | 0.15 % | No |
| – Failure Analysis | 3 | 0.15 % | No |
| 300FA – Failure | 3 | 0.15 % | No |
| MicroINSPECT 300FA – | 3 | 0.15 % | No |
| Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| – EAGLEview Desktop | 3 | 0.15 % | No |
| Wafer Sorter MicroINSPECT | 3 | 0.15 % | No |
| Alone Wafer Sorter | 3 | 0.15 % | No |
| Stand Alone Wafer | 3 | 0.15 % | No |
| – Stand Alone | 3 | 0.15 % | No |
| EAGLEview Desktop Client | 3 | 0.15 % | No |
SEO Keywords (Four Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| – Microscope Wafer Inspection | 4 | 0.20 % | No |
| MicroINSPECT – Microscope Wafer | 4 | 0.20 % | No |
| Microscope Wafer Inspection MicroINSPECT | 4 | 0.20 % | No |
| – EAGLEview Desktop Client | 3 | 0.15 % | No |
| Wafer Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| Alone Wafer Sorter MicroINSPECT | 3 | 0.15 % | No |
| Wafer Sorter MicroINSPECT – | 3 | 0.15 % | No |
| Sorter MicroINSPECT – Microscope | 3 | 0.15 % | No |
| Inspection MicroINSPECT 300FA – | 3 | 0.15 % | No |
| – Stand Alone Wafer | 3 | 0.15 % | No |
| MicroINSPECT 300FA – Failure | 3 | 0.15 % | No |
| 300FA – Failure Analysis | 3 | 0.15 % | No |
| Defect Review Images and | 3 | 0.15 % | No |
| – Defect Review Images | 3 | 0.15 % | No |
| Software – Defect Review | 3 | 0.15 % | No |
| SITEview Software – Defect | 3 | 0.15 % | No |
| ProcessGuard – EAGLEview Desktop | 3 | 0.15 % | No |
| Stand Alone Wafer Sorter | 3 | 0.15 % | No |
| MicroSORT – Stand Alone | 3 | 0.15 % | No |
| Review Images and Sorting | 3 | 0.15 % | No |
Internal links in - microtronicinc.xyz
Contact Us
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Site Map
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Company
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Microtronic Innovation Highlights
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Products
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
EAGLEview – Auto Macro Wafer Defect Inspection
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
MicroSORT – Stand Alone Wafer Sorter
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
MicroINSPECT – Microscope Wafer Inspection
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Customized Solutions
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
ProcessGuard – EAGLEview Desktop Client
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
SITEview Software – Defect Review, Images, and Sorting
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Technologies
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Applications
Semiconductor Wafer Defect Inspection Applications | Equipment
Semiconductor Wafer Defect Inspection Applications | Equipment
Defect Library
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
1-877-642-7687 1-508-627-8951
info {at} microtronic.com
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Arcing Defects
Arcing Semiconductor Wafer Macro Defect
Arcing Semiconductor Wafer Macro Defect
2 Chamber Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
3 Chamber Macro Defect
3 Chamber Semiconductor Macro Wafer Defect
3 Chamber Semiconductor Macro Wafer Defect
Backside Contamination
Semiconductor Backside Contamination Macro Defect
Semiconductor Backside Contamination Macro Defect
Poor Rinse – Macro Defect
Semiconductor Macro Defect | Insufficient Rinse
Semiconductor Macro Defect | Insufficient Rinse
Edge Chips – Macro Defects
Semiconductor Edge Chip Macro Defects
Semiconductor Edge Chip Macro Defects
CMP – Macro Defects
Semiconductor Wafer CMP Macro Defects
Semiconductor Wafer CMP Macro Defects
Wafer Contamination – Large
Semiconductor Wafer Contamination Macro Defects
Semiconductor Wafer Contamination Macro Defects
Wafer Contamination – Small
Semiconductor Wafer Small Contamination Macro Defect
Semiconductor Wafer Small Contamination Macro Defect
EBR Drip Defect
Semiconductor Wafer Edge Bead Macro Defect
Semiconductor Wafer Edge Bead Macro Defect
Developer Related Defects
Semiconductor Wafer Developer Macro Defect
Semiconductor Wafer Developer Macro Defect
Wafer Edge Discoloration
Semiconductor Wafer Edge Discoloration Macro Defect
Semiconductor Wafer Edge Discoloration Macro Defect
Flashfield Defects
Semiconductor Wafer Flashfield Macro Defect
Semiconductor Wafer Flashfield Macro Defect
First 12 Wafers – Different
Semiconductor Wafer Compared to Reference Wafer
Semiconductor Wafer Compared to Reference Wafer
Wafer Hotspot Defects
Wafer Hotspot Defects
Wafer Hotspot Defects
Lens Stepper Macro Defects
Lens Stepper Macro Defect
Lens Stepper Macro Defect
Missing Patterns
Missing Pattern Macro Defects
Missing Pattern Macro Defects
Particle Defects
Particle examples detected by EAGLEview
Particle examples detected by EAGLEview
Poly Haze Macro Defect
Poly Haze Macro Defect
Poly Haze Macro Defect
Partial Pattern – No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Microtronicinc.xyz Spined HTML
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment Home | Contact Us | Site Map HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect Library Home » Products » MicroINSPECT – Microscope Wafer Inspection MicroINSPECT Semiconductor Wafer Microscope Inspection SystemWideRobotics, Microscopes with SITEview Software Automate Micro or Macro Defect Inspection MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection. SITEview Software automates all microscope functions, metrology routines, and a wide variety of operations that make the wafer defect inspection process quicker and increasingly well-judged while minimizing operator errors. MicroINSPECTStreamlinedSemiconductor Wafer Inspection System Running SITEview Software MicroINSPECT Wafer Defect Inspection Systems PDF MicroINSPECT Semiconductor Wafer Defect Inspection System MicroINSPECT system automates sophisticated semiconductor wafer inspection – micro or macro – for semiconductor wafers ranging in size from 50 mm to 450 mm. The MicroINSPECT wafer inspection system couples a state-of-the-art robotics semiconductor wafer handler with a Zeiss Axiotron 2 inspection microscope or any other major trademark inspection microscope of your choosing, together with the Microtronic SITEview software. MicroINSPECT 300 FA Failure AnalysisStreamlinedSemiconductor Wafer Inspection Our innovative configuration provides a simple to operate, yet powerful enough, defect inspection tool for plane the most wide microscopist. SITEview Software Automates Microscope & Optical Inspection Functions SITEview inspection recipes are modular ASCII files which may be created off-line or interactively on-line. Recipes may be created at a semiconductor die, field, or wafer level. SITEview allows streamlined microscope functions, metrology routines, and calls to the internal SITEview writ set to run at each inspection site. During wafer inspection, operators may add, move, or update inspection sites for identifying repetitive defects. Defect codes, comments, measurement results, and images are stored in the data file. For simple transmission inspection, a user may click on a semiconductor wafer slot icon and select ‘micro inspection’ to automatically place the wafer correctly on the stage. After visual inspection, the semiconductor wafer is returned by pressing the ‘store wafer’ sawed-off or any empty slot. When integrated with an OCR reader, SITEview speeds semiconductor wafer throughput by combining wafer inspection and wafer sorting in one operation without loss of time during wafer inspection. Sort routines may be appended to the end of an inspection recipe. MicroINSPECT Semiconductor Wafer Inspection System Key Features Custom Configurations of MicroINSPECT Semiconductor Wafer Defect Inspection System Include: 50mm to 450mm Wafers 1 to 4 Cassette Towers Motorized Tilt Back with or without Integrated Flat / Notch Aligner Auto Recognition of Mult-cassette Sizes OCR Cassette BCR Laser Marker Compatible High Res Flat Screen Display EAGLEviewStreamlinedMacro Defect Inspection System Compatibility Integrate with any microscope or your existing wafer inspection microscopes Confocal UV Optics High Speed Dual Arm Robots and Stages Standard and High Accuracy Stage Small Footprint Enclosure SITEview Software Applications for MicroINSPECT Visual Inspection Defect Review Knights Navigation Software OCR Read Sorting Second Optical Review Image Storage & Retrieval Laser Marking GEMS/SECS II Host Communication — LAN Microscope Interface / UV Microscope InterfaceWideRobotics Fast & Easy Robot Setup Maintenance Friendly Detailed Diagnostics Easy to Navigate GUI Service Interface that simplifies diagnostics and provides streamlined robot teach routines for each wafer mart position SITEview provides an easy upgrade path for existing LEP Mac based systems (c) Copyright Microtronic, Inc. 1994 - 2013 All Rights Reserved MicroINSPECT Semiconductor Wafer Inspection System CONTACT US 1-877-642-7687 1-508-627-8951 info {at} microtronic.com Microtronic Overview Video Microtronic EAGLEview Video Gallery of Macro Defects Detected By EAGLEview Arcing Defects 2 Chamber Macro Defect 3 Chamber Macro Defect Backside Contamination Blocked Etch Macro Defect Poor Rinse – Macro Defect Edge Chips – Macro Defects CMP – Macro Defects Wafer Contamination – Large Wafer Contamination – Small EBR Drip Defect Developer Related Defects Wafer Edge Discoloration Flashfield Defects First 12 Wafers – Different Wafer Hotspot Defects Lens Stepper Macro Defects Missing Patterns Particle Defects Poly Haze Macro Defect Partial Pattern – No Expose Previous Layer Defects Rework – Scrap Avoidance Rework – Yield Improvement Scratches By Human Scratches By Machine Center Spin Macro Defect Spin Defect on Edge Spin Defect – Entire Wafer Spin Defect – Line Reticle Tilt Defect Semiconductor Wafer Inspection ProductsEAGLEview – Auto Macro Wafer Defect Inspection ProcessGuard – EAGLEview Desktop Client MicroSORT – Stand Alone Wafer Sorter MicroINSPECT – Microscope Wafer Inspection MicroINSPECT 300FA – Failure Analysis SITEview Software – Defect Review, Images, and Sorting Customized Solutions HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect LibraryPrivacyTerms of UseSite Map © Copyright Microtronic Inc. 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