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Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
microtronicinc.xyzMicrotronic is a US based manufacturer that develops semiconductor wafer defect inspection equipment, semiconductor wafer sorters, semiconductor metrology equipment and related semiconductor wafer defect inspection software Based in Hawthorne, NY the company serves a global client base of Tier 1 semiconductor manufacturers, fab plants, and device manufacturers throughout the world.
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SEO audit: Content analysis
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| Title | Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic | ||||||||||||||||||||||||||||||||||||
| Text / HTML ratio | 34 % | ||||||||||||||||||||||||||||||||||||
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| Keywords cloud | – Wafer Defect Macro Inspection Microtronic Software wafer inspection Defects macro EAGLEview Technologies systems MicroINSPECT solutions Semiconductor Sorting — cassette | ||||||||||||||||||||||||||||||||||||
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| Images | We found 36 images on this web page. |
SEO Keywords (Single)
| Keyword | Occurrence | Density |
|---|---|---|
| – | 32 | 1.60 % |
| Wafer | 23 | 1.15 % |
| Defect | 23 | 1.15 % |
| Macro | 16 | 0.80 % |
| Inspection | 15 | 0.75 % |
| Microtronic | 14 | 0.70 % |
| Software | 13 | 0.65 % |
| wafer | 12 | 0.60 % |
| inspection | 12 | 0.60 % |
| Defects | 10 | 0.50 % |
| macro | 9 | 0.45 % |
| EAGLEview | 8 | 0.40 % |
| Technologies | 8 | 0.40 % |
| systems | 6 | 0.30 % |
| MicroINSPECT | 6 | 0.30 % |
| solutions | 6 | 0.30 % |
| Semiconductor | 6 | 0.30 % |
| Sorting | 5 | 0.25 % |
| — | 5 | 0.25 % |
| cassette | 5 | 0.25 % |
SEO Keywords (Two Word)
| Keyword | Occurrence | Density |
|---|---|---|
| Wafer Inspection | 9 | 0.45 % |
| Macro Defect | 8 | 0.40 % |
| Semiconductor Wafer | 6 | 0.30 % |
| SITEview Software | 5 | 0.25 % |
| Defect Inspection | 5 | 0.25 % |
| Auto Macro | 5 | 0.25 % |
| Macro Wafer | 4 | 0.20 % |
| Defect Review | 4 | 0.20 % |
| Macro Defects | 4 | 0.20 % |
| Software – | 4 | 0.20 % |
| Wafer Defect | 4 | 0.20 % |
| Inspection MicroINSPECT | 3 | 0.15 % |
| MicroINSPECT 300FA | 3 | 0.15 % |
| 300FA – | 3 | 0.15 % |
| – Failure | 3 | 0.15 % |
| Failure Analysis | 3 | 0.15 % |
| ProcessGuard – | 3 | 0.15 % |
| Customized Solutions | 3 | 0.15 % |
| – Microscope | 3 | 0.15 % |
| – EAGLEview | 3 | 0.15 % |
SEO Keywords (Three Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| Semiconductor Wafer Inspection | 5 | 0.25 % | No |
| SITEview Software – | 4 | 0.20 % | No |
| Wafer Defect Inspection | 4 | 0.20 % | No |
| Auto Macro Wafer | 4 | 0.20 % | No |
| Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| Sorter MicroINSPECT – | 3 | 0.15 % | No |
| MicroINSPECT – Microscope | 3 | 0.15 % | No |
| – Microscope Wafer | 3 | 0.15 % | No |
| Microscope Wafer Inspection | 3 | 0.15 % | No |
| Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
| 300FA – Failure | 3 | 0.15 % | No |
| MicroINSPECT 300FA – | 3 | 0.15 % | No |
| Defect Review Images | 3 | 0.15 % | No |
| – Failure Analysis | 3 | 0.15 % | No |
| ProcessGuard – EAGLEview | 3 | 0.15 % | No |
| – EAGLEview Desktop | 3 | 0.15 % | No |
| EAGLEview Desktop Client | 3 | 0.15 % | No |
| Images and Sorting | 3 | 0.15 % | No |
| Review Images and | 3 | 0.15 % | No |
| Software – Defect | 3 | 0.15 % | No |
SEO Keywords (Four Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| Software – Defect Review | 3 | 0.15 % | No |
| – Defect Review Images | 3 | 0.15 % | No |
| 300FA – Failure Analysis | 3 | 0.15 % | No |
| MicroINSPECT 300FA – Failure | 3 | 0.15 % | No |
| Inspection MicroINSPECT 300FA – | 3 | 0.15 % | No |
| Wafer Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| Microscope Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
| – Microscope Wafer Inspection | 3 | 0.15 % | No |
| MicroINSPECT – Microscope Wafer | 3 | 0.15 % | No |
| Sorter MicroINSPECT – Microscope | 3 | 0.15 % | No |
| Wafer Sorter MicroINSPECT – | 3 | 0.15 % | No |
| Alone Wafer Sorter MicroINSPECT | 3 | 0.15 % | No |
| Stand Alone Wafer Sorter | 3 | 0.15 % | No |
| – Stand Alone Wafer | 3 | 0.15 % | No |
| MicroSORT – Stand Alone | 3 | 0.15 % | No |
| ProcessGuard – EAGLEview Desktop | 3 | 0.15 % | No |
| SITEview Software – Defect | 3 | 0.15 % | No |
| Macro Wafer Defect Inspection | 3 | 0.15 % | No |
| Defect Review Images and | 3 | 0.15 % | No |
| Auto Macro Wafer Defect | 3 | 0.15 % | No |
Internal links in - microtronicinc.xyz
Contact Us
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Site Map
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Company
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Microtronic Innovation Highlights
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Products
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
EAGLEview – Auto Macro Wafer Defect Inspection
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
MicroSORT – Stand Alone Wafer Sorter
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
MicroINSPECT – Microscope Wafer Inspection
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Customized Solutions
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
ProcessGuard – EAGLEview Desktop Client
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
SITEview Software – Defect Review, Images, and Sorting
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Technologies
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Applications
Semiconductor Wafer Defect Inspection Applications | Equipment
Semiconductor Wafer Defect Inspection Applications | Equipment
Defect Library
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
1-877-642-7687 1-508-627-8951
info {at} microtronic.com
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Arcing Defects
Arcing Semiconductor Wafer Macro Defect
Arcing Semiconductor Wafer Macro Defect
2 Chamber Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
3 Chamber Macro Defect
3 Chamber Semiconductor Macro Wafer Defect
3 Chamber Semiconductor Macro Wafer Defect
Backside Contamination
Semiconductor Backside Contamination Macro Defect
Semiconductor Backside Contamination Macro Defect
Poor Rinse – Macro Defect
Semiconductor Macro Defect | Insufficient Rinse
Semiconductor Macro Defect | Insufficient Rinse
Edge Chips – Macro Defects
Semiconductor Edge Chip Macro Defects
Semiconductor Edge Chip Macro Defects
CMP – Macro Defects
Semiconductor Wafer CMP Macro Defects
Semiconductor Wafer CMP Macro Defects
Wafer Contamination – Large
Semiconductor Wafer Contamination Macro Defects
Semiconductor Wafer Contamination Macro Defects
Wafer Contamination – Small
Semiconductor Wafer Small Contamination Macro Defect
Semiconductor Wafer Small Contamination Macro Defect
EBR Drip Defect
Semiconductor Wafer Edge Bead Macro Defect
Semiconductor Wafer Edge Bead Macro Defect
Developer Related Defects
Semiconductor Wafer Developer Macro Defect
Semiconductor Wafer Developer Macro Defect
Wafer Edge Discoloration
Semiconductor Wafer Edge Discoloration Macro Defect
Semiconductor Wafer Edge Discoloration Macro Defect
Flashfield Defects
Semiconductor Wafer Flashfield Macro Defect
Semiconductor Wafer Flashfield Macro Defect
First 12 Wafers – Different
Semiconductor Wafer Compared to Reference Wafer
Semiconductor Wafer Compared to Reference Wafer
Wafer Hotspot Defects
Wafer Hotspot Defects
Wafer Hotspot Defects
Lens Stepper Macro Defects
Lens Stepper Macro Defect
Lens Stepper Macro Defect
Missing Patterns
Missing Pattern Macro Defects
Missing Pattern Macro Defects
Particle Defects
Particle examples detected by EAGLEview
Particle examples detected by EAGLEview
Poly Haze Macro Defect
Poly Haze Macro Defect
Poly Haze Macro Defect
Partial Pattern – No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Microtronicinc.xyz Spined HTML
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic Home | Contact Us | Site Map HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview –WheelsMacro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect Library Home » Technologies Microtronic Technologies Have Set the Pace for Semiconductor Wafer Inspection Since 1994 Market Leading Semiconductor Wafer Defect Inspection Technologies Microtronic’s decades of wits in micro and macro optical inspection, macro wafer inspection technologies, semiconductor wafer sorting systems, and metrology technologies gives us unparallelled knowledge and expertise when it comes to developing wafer inspection solutions. An Integrated Solution Set for Semiconductor Wafer Inspection, Sorting, Metrology From this experience, we have been worldly-wise to develop the quintessential wheels macro wafer defect inspection system — Microtronic EAGLEview. However, considering all Microtronic systems are modular we are worldly-wise to tailor solutions to your particular requirements by providing just the technologies and solutions you need. Our tideway makes it much easier and increasingly forfeit constructive for our clients to reap customized solutions and upgrades to their existing Microtronic equipment. From Microscopes toWheelsMacro Wafer Inspection Systems Early in the company’s history, we provided only microscopes for transmission wafer defect inspection. We did well and earned the trust of top tier semiconductor fabs virtually the world. Today we develop completely integrated wafer inspection solutions that include macro and micro wafer defect inspection equipment, wheels macro defect inspection systems, imaging technologies, standalone sorters, integrated sorter/inspection systems, transmission and motorized microscopes, wide wafer handling robots, and wafer staging systems. Core Microtronic Technologies Include: Optical Microscopy – We provide solutions based on inspection microscopes by Zeiss, Nikon, Leica, and other brands. Fully motorized tenancy by Microtronic SITEview Software, full variety of optical inspection techniques: bright-field, dark-field, differential interference contrast, UV, and confocal. Automated Macro Defect Semiconductor Wafer Inspection Systems UpperSpeed , over 3,000+ wafers per day throughput, 2 cassette, 4 cassette, SMIF and 300mm to 200mm Bridge Tool configurations. Fully streamlined macro inspection, whole wafer image storage and retrieval, integrated OCR reader and wafer randomization. Creates microscope review file and Guardbanding files. Semiconductor Wafer Sorters — Sorting systems for 50mm to 450mm wafers: can move, compress, randomize, find, align, verify, and split lots. Hardware includes: upper through dual arm robot handler, motorized tilt when towers with integrated unappetizing / notch finder, multiple cassette size recognition, safety proximity sensors, and other custom applications. Microtronic System Software Applications SITEview Software – This single software using controls the robotic, transmission or motorized stage, aligner, tilt, wobble macro, heinie macro, tilt-back cassette towers, integrated cassette wafer aligners, stock-still or hand-held bar lawmaking reader, OCR, cameras, imaging, pattern recognition, and inspection microscopes. EAGLEview’s ProcessGuard Software — EAGLEview’s RevolutionaryWheelsMacro Defect Inspection Management Software. EAGLEimage Software — Image Acquisition Software Defect Review Software Second Optical Inspection Software Knights Navigational Software Communication & Networking Technology Wafer Handling Robots — dual arm robots, non-contact optical aligners, macro unexceptionable light with tilt/wobble or when side inspection modules, will-less tilting cassettes Motorized Microscope Stages – Anti-Migration Technology Pattern Recognition Technology OCR Technologies (c) Copyright 1994 - 2014 Microtronic, Inc. All Rights Reserved . | Microtronic Semiconductor Wafer Inspection Systems, Sorters and Metrology Technologies CONTACT US 1-877-642-7687 1-508-627-8951 info {at} microtronic.com Microtronic Overview Video Microtronic EAGLEview Video Gallery of Macro Defects Detected By EAGLEview Arcing Defects 2 Chamber Macro Defect 3 Chamber Macro DefectHeinieContamination Blocked Etch Macro Defect Poor Rinse – Macro Defect Edge Chips – Macro Defects CMP – Macro Defects Wafer Contamination – Large Wafer Contamination – Small EBR Drip Defect Developer Related Defects Wafer Edge Discoloration Flashfield Defects First 12 Wafers – Different Wafer Hotspot Defects Lens Stepper Macro Defects Missing Patterns Particle Defects Poly Haze Macro Defect Partial Pattern – No Expose Previous Layer Defects Rework – Scrap Avoidance Rework – Yield Improvement Scratches By Human Scratches By Machine Center Spin Macro Defect Spin Defect on Edge Spin Defect – Entire Wafer Spin Defect – Line Reticle Tilt Defect Semiconductor Wafer Inspection ProductsEAGLEview –WheelsMacro Wafer Defect Inspection ProcessGuard – EAGLEview Desktop Client MicroSORT – Stand Alone Wafer Sorter MicroINSPECT – Microscope Wafer Inspection MicroINSPECT 300FA – Failure Analysis SITEview Software – Defect Review, Images, and Sorting Customized Solutions HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview –WheelsMacro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect LibraryPrivacyTerms of UseSite Map © Copyright Microtronic Inc. 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