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StreamlinedMacro Defect Detection Solutions Home | Contact Us | Site Map HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect Library Home » Products » Customized Solutions Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | SystemsStreamlinedSemiconductor Wafer Testing, Defect Inspection, Sorting, and Microscope Solutions Customized to your Particular Needs Unique Needs? Need largest wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who's not a sales person? We've been providing well-constructed semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994. We can help. We've built our name in the semiconductor wafer defect inspection and wafer testing market by working closely with our tier-1 semiconductor and fab customers virtually the globe. Engineer to engineer we have solved some sticky problems through the years. We know what works and what doesn't so if you have special requirements requite us a call, and we'll work together to build a solution that fits your particular environment. Microtronic Welcomes Customer Collaboration to Customize Semiconductor Defect Inspection Apps Customized Semiconductor Wafer Inspection, Sorter, and Microscope Solutions for Your Particular Semiconductor Manufacturing Requirements Let’s squatter it, no two semiconductor production facilities are exactly the same, and everyone has unique requirements.  Microtronic prides itself not only for providing state-of-the-art semiconductor wafer inspection and sorter equipment “out-of-the-box” but moreover for designing and towers streamlined wafer inspection solutions that are customized to fit your specific needs.  We are semiconductor wafer defect inspection experts with decades of wits with virtually all of the components and equipment in the semiconductor equipment market, including: wide robotics, wafer handlers, sorters, scanners, microscopes, and the using software and database programs to tie it all together in an elegant, user-focused solution. We know what works and what doesn’t.  We know the pitfalls and problems with existing solutions as semiconductor production processes and wafers wilt increasingly ramified and evolve.  We are here to help you meet those challenges by providing customized semiconductor wafer inspection solutions that fit perfectly with your people, processes, and technology, while helping to protect your overall investment.     Microtronic Addresses The Most Demanding Semiconductor Wafer Defect Inspection Challenges Customized Semiconductor Wafer Inspection, Sorter, & Imaging Technologies, Products and Applications CustomizedStreamlinedMacro Defect Wafer Inspection Systems from 1 to 4 cassettes. 50mm to 450mm Customized configurations and integration of Microtronic ProcessGuard and SITEview Software Integrated Solutions for Wafer Defect Inspection, Sorter, and MicroscopesStreamlinedrobotic microscope integrations for Micro and Macro Defect Wafer Inspection Customized streamlined wafer inspection and wafer sorting systems and softwareWideclassification and review systems Customized Robotic Microscope and Metrology Systems Customized User Interfaces Semiconductor wafer image creation, storage, retrieval, and wringer for your environment Defect Image Database Creation, Classification, Review (c) Copyright 1994-2014 Microtronic, Inc. All Rights Reserved Customized Semiconductor Wafer Inspection, Sorting and Metrology Equipment | Microscope Systems CONTACT US 1-877-642-7687 1-508-627-8951 info {at} microtronic.com Microtronic Overview Video Microtronic EAGLEview Video Gallery of Macro Defects Detected By EAGLEview Arcing Defects 2 Chamber Macro Defect 3 Chamber Macro Defect Backside Contamination Blocked Etch Macro Defect Poor Rinse – Macro Defect Edge Chips – Macro Defects CMP – Macro Defects Wafer Contamination – Large Wafer Contamination – Small EBR Drip Defect Developer Related Defects Wafer Edge Discoloration Flashfield Defects First 12 Wafers – Different Wafer Hotspot Defects Lens Stepper Macro Defects Missing Patterns Particle Defects Poly Haze Macro Defect Partial Pattern – No Expose Previous Layer Defects Rework – Scrap Avoidance Rework – Yield Improvement Scratches By Human Scratches By Machine Center Spin Macro Defect Spin Defect on Edge Spin Defect – Entire Wafer Spin Defect – Line Reticle Tilt Defect Semiconductor Wafer Inspection ProductsEAGLEview – Auto Macro Wafer Defect Inspection ProcessGuard – EAGLEview Desktop Client MicroSORT – Stand Alone Wafer Sorter MicroINSPECT – Microscope Wafer Inspection MicroINSPECT 300FA – FailureWringerSITEview Software – Defect Review, Images, and Sorting Customized Solutions HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview – Auto Macro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect LibraryPrivacyTerms of UseSite Map © Copyright Microtronic Inc. 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