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ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
microtronicinc.xyzMicrotronic is a leading US-based manufacturer and designer of semiconductor automated macro defect wafer inspection equipment, sorter equipment and metrology systems for semiconductor wafer inspection.
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SEO audit: Content analysis
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| Title | ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software | ||||||||||||||||||||||||||||||||||||
| Text / HTML ratio | 33 % | ||||||||||||||||||||||||||||||||||||
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| Flash | Excellent! The website does not have any flash contents. | ||||||||||||||||||||||||||||||||||||
| Keywords cloud | – Defect Wafer ProcessGuard Macro EAGLEview Inspection Software Defects wafer inspection Microtronic defect Review Analysis MicroINSPECT Semiconductor Desktop Images semiconductor | ||||||||||||||||||||||||||||||||||||
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| Images | We found 39 images on this web page. |
SEO Keywords (Single)
| Keyword | Occurrence | Density |
|---|---|---|
| – | 30 | 1.50 % |
| Defect | 29 | 1.45 % |
| Wafer | 26 | 1.30 % |
| ProcessGuard | 18 | 0.90 % |
| Macro | 16 | 0.80 % |
| EAGLEview | 15 | 0.75 % |
| Inspection | 14 | 0.70 % |
| Software | 14 | 0.70 % |
| Defects | 10 | 0.50 % |
| wafer | 10 | 0.50 % |
| inspection | 9 | 0.45 % |
| Microtronic | 9 | 0.45 % |
| defect | 8 | 0.40 % |
| Review | 6 | 0.30 % |
| Analysis | 6 | 0.30 % |
| MicroINSPECT | 6 | 0.30 % |
| Semiconductor | 6 | 0.30 % |
| Desktop | 5 | 0.25 % |
| Images | 5 | 0.25 % |
| semiconductor | 5 | 0.25 % |
SEO Keywords (Two Word)
| Keyword | Occurrence | Density |
|---|---|---|
| Macro Defect | 8 | 0.40 % |
| Defect Inspection | 8 | 0.40 % |
| Wafer Defect | 8 | 0.40 % |
| ProcessGuard Software | 6 | 0.30 % |
| defect inspection | 6 | 0.30 % |
| Semiconductor Wafer | 5 | 0.25 % |
| wafer defect | 5 | 0.25 % |
| Desktop Client | 5 | 0.25 % |
| Wafer Inspection | 5 | 0.25 % |
| Defect Review | 5 | 0.25 % |
| SITEview Software | 4 | 0.20 % |
| EAGLEview Desktop | 4 | 0.20 % |
| – EAGLEview | 4 | 0.20 % |
| ProcessGuard – | 4 | 0.20 % |
| Macro Defects | 4 | 0.20 % |
| Failure Analysis | 3 | 0.15 % |
| Inspection MicroINSPECT | 3 | 0.15 % |
| MicroINSPECT 300FA | 3 | 0.15 % |
| 300FA – | 3 | 0.15 % |
| – Failure | 3 | 0.15 % |
SEO Keywords (Three Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| Wafer Defect Inspection | 7 | 0.35 % | No |
| wafer defect inspection | 5 | 0.25 % | No |
| EAGLEview Desktop Client | 4 | 0.20 % | No |
| – EAGLEview Desktop | 4 | 0.20 % | No |
| ProcessGuard – EAGLEview | 4 | 0.20 % | No |
| Images and Sorting | 3 | 0.15 % | No |
| MicroINSPECT 300FA – | 3 | 0.15 % | No |
| MicroINSPECT – Microscope | 3 | 0.15 % | No |
| – Microscope Wafer | 3 | 0.15 % | No |
| Microscope Wafer Inspection | 3 | 0.15 % | No |
| Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
| Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| Defect Inspection Management | 3 | 0.15 % | No |
| 300FA – Failure | 3 | 0.15 % | No |
| – Failure Analysis | 3 | 0.15 % | No |
| Alone Wafer Sorter | 3 | 0.15 % | No |
| SITEview Software – | 3 | 0.15 % | No |
| Software – Defect | 3 | 0.15 % | No |
| – Defect Review | 3 | 0.15 % | No |
| Defect Review Images | 3 | 0.15 % | No |
SEO Keywords (Four Word)
| Keyword | Occurrence | Density | Possible Spam |
|---|---|---|---|
| ProcessGuard – EAGLEview Desktop | 4 | 0.20 % | No |
| – EAGLEview Desktop Client | 4 | 0.20 % | No |
| – Stand Alone Wafer | 3 | 0.15 % | No |
| Stand Alone Wafer Sorter | 3 | 0.15 % | No |
| Alone Wafer Sorter MicroINSPECT | 3 | 0.15 % | No |
| Wafer Sorter MicroINSPECT – | 3 | 0.15 % | No |
| Sorter MicroINSPECT – Microscope | 3 | 0.15 % | No |
| MicroINSPECT – Microscope Wafer | 3 | 0.15 % | No |
| – Microscope Wafer Inspection | 3 | 0.15 % | No |
| Microscope Wafer Inspection MicroINSPECT | 3 | 0.15 % | No |
| Wafer Inspection MicroINSPECT 300FA | 3 | 0.15 % | No |
| Inspection MicroINSPECT 300FA – | 3 | 0.15 % | No |
| MicroINSPECT 300FA – Failure | 3 | 0.15 % | No |
| 300FA – Failure Analysis | 3 | 0.15 % | No |
| Defect Review Images and | 3 | 0.15 % | No |
| Software – Defect Review | 3 | 0.15 % | No |
| SITEview Software – Defect | 3 | 0.15 % | No |
| MicroSORT – Stand Alone | 3 | 0.15 % | No |
| – Defect Review Images | 3 | 0.15 % | No |
| Review Images and Sorting | 3 | 0.15 % | No |
Internal links in - microtronicinc.xyz
Contact Us
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Site Map
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Company
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Company Overview | Manufacturer Auto Macro Defect Wafer Inspection Systems
Microtronic Innovation Highlights
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Best New Semiconductor Wafer Defect Inspection Products | Technologies | Innovations
Products
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
EAGLEview – Auto Macro Wafer Defect Inspection
Automated Macro Defect Semiconductor Wafer Inspection Equipment
Automated Macro Defect Semiconductor Wafer Inspection Equipment
MicroSORT – Stand Alone Wafer Sorter
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
Automated Semiconductor Wafer Sorter | Manufacturer | Supplier
MicroINSPECT – Microscope Wafer Inspection
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Semiconductor Wafer Inspection Microscope Tools | Manufacturer | Testing Equipment
Customized Solutions
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
ProcessGuard – EAGLEview Desktop Client
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software
SITEview Software – Defect Review, Images, and Sorting
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Optical Inspection & Metrology Software for Automated Semiconductor Wafer Inspection
Technologies
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Semiconductor Wafer Defect Inspection Systems, Sorters, Microscopes | Microtronic
Applications
Semiconductor Wafer Defect Inspection Applications | Equipment
Semiconductor Wafer Defect Inspection Applications | Equipment
Defect Library
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
1-877-642-7687 1-508-627-8951
info {at} microtronic.com
Automated Macro Defect Detection Solutions
Automated Macro Defect Detection Solutions
Arcing Defects
Arcing Semiconductor Wafer Macro Defect
Arcing Semiconductor Wafer Macro Defect
2 Chamber Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
2 Chamber Semiconductor Wafer Macro Defect
3 Chamber Macro Defect
3 Chamber Semiconductor Macro Wafer Defect
3 Chamber Semiconductor Macro Wafer Defect
Backside Contamination
Semiconductor Backside Contamination Macro Defect
Semiconductor Backside Contamination Macro Defect
Poor Rinse – Macro Defect
Semiconductor Macro Defect | Insufficient Rinse
Semiconductor Macro Defect | Insufficient Rinse
Edge Chips – Macro Defects
Semiconductor Edge Chip Macro Defects
Semiconductor Edge Chip Macro Defects
CMP – Macro Defects
Semiconductor Wafer CMP Macro Defects
Semiconductor Wafer CMP Macro Defects
Wafer Contamination – Large
Semiconductor Wafer Contamination Macro Defects
Semiconductor Wafer Contamination Macro Defects
Wafer Contamination – Small
Semiconductor Wafer Small Contamination Macro Defect
Semiconductor Wafer Small Contamination Macro Defect
EBR Drip Defect
Semiconductor Wafer Edge Bead Macro Defect
Semiconductor Wafer Edge Bead Macro Defect
Developer Related Defects
Semiconductor Wafer Developer Macro Defect
Semiconductor Wafer Developer Macro Defect
Wafer Edge Discoloration
Semiconductor Wafer Edge Discoloration Macro Defect
Semiconductor Wafer Edge Discoloration Macro Defect
Flashfield Defects
Semiconductor Wafer Flashfield Macro Defect
Semiconductor Wafer Flashfield Macro Defect
First 12 Wafers – Different
Semiconductor Wafer Compared to Reference Wafer
Semiconductor Wafer Compared to Reference Wafer
Wafer Hotspot Defects
Wafer Hotspot Defects
Wafer Hotspot Defects
Lens Stepper Macro Defects
Lens Stepper Macro Defect
Lens Stepper Macro Defect
Missing Patterns
Missing Pattern Macro Defects
Missing Pattern Macro Defects
Particle Defects
Particle examples detected by EAGLEview
Particle examples detected by EAGLEview
Poly Haze Macro Defect
Poly Haze Macro Defect
Poly Haze Macro Defect
Partial Pattern – No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Semiconductor Macro Defect | Partial Pattern - No Expose
Microtronicinc.xyz Spined HTML
ProcessGUARD | Semiconductor Wafer Defect Inspection Management Software Home | Contact Us | Site Map HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview –WheelsMacro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect Library Home » Products » ProcessGuard – EAGLEview DesktopVendeeMicrotronic ProcessGuard Semiconductor Wafer Defect Inspection Management Software Automate Your Macro Defect Semiconductor Wafer Inspection Processes and Equipment ProcessGuard wheels macro semiconductor wafer defect inspection software gives you the flexibility and tenancy over your defect wafer inspection process by unleashing the power to customize your user interface and using features to exactly what your semiconductor wafer defect inspection production process requires. ProcessGuard Software running on EAGLEview is a high-throughput wheels macro inspection tool that inspects 100% of the manufactured semiconductor wafers. All lot wafer-to-wafer macro variations are identified and logged. ProcessGuard Software manages upper resolution full-sized wafer images and data from EAGLEview that provides the hair-trigger information to make immediate, cost-saving, and yield-protecting touching-up decisions in the most timely manner. Contact us today for a sit-in and wafer defect inspection assessment. ProcessGuard Wafer Defect Inspection Management Software ProcessGuard Software | Semiconductor Wafer Defect Inspection Management Microtronic ProcessGuard Software is the desktop vendee for the EAGLEview wheels macro wafer defect inspection system. ProcessGuard is a upper volume, upper speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGuard is full-length rich (see below) and its newest releases include well-constructed wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base. The Same Semiconductor Wafer Can be Viewed From Multiple Log Points Microtronic ProcessGuard Software running on EAGLEview enables unique capabilities and applications to speed your wafer inspection processes and provide a increasingly well-judged and efficient overall testing environment. Key Capabilities, Applications, and Features of ProcessGuard Software Running on an EAGLEview System include: DesktopVendeefor EAGLEview Wafer Randomization Analysis Software Integrated User-Defined Defect Libary Integrated Trainer & Knowledge BaseUpperVolume Macro Inspection tool which inspects 100% of semiconductor wafers SITEview Software IntegratedFull-lengthRich, Customizable User Interface Customizable Query Screens Advanced Imaging Storage and Retrieval Large High-Resolution Wafer Images ProcessGuard Enables Defect Review Overlay and Guard Banding at Multiple Levels Aut0 Archive Wafer Images Image Storage and Retrieval Database Thumbnail images of wafer created automatically Wafer Defect Inspection Data Management Compiled Lot Lists Data Can be Sorted by Class Codes, Tools, Log Points, Time, or Device Lot and Equipment Historical Data Unique Drill-Down Capability for Root Cause Analysis Incoming and Outgoing Slot Order Edge Bead Removal Review (EBR) View Multiple Log Points for Each Wafer Applications and Processes ProcessGuard Allows you to Inspect, View, and Image Multiple Layers of Each Wafer Defect Overlay KLARF File Compatibility PARETO Analysis Guard-Banding (ink-off) Bump Process CMP Defect Review Copyright (c) Microtronic, Inc. 1994 - 2014 All Rights Reserved | ProcessGuard Semiconductor Automated Macro Defect Inspection Software CONTACT US 1-877-642-7687 1-508-627-8951 info {at} microtronic.com Microtronic Overview Video Microtronic EAGLEview Video Gallery of Macro Defects Detected By EAGLEview Arcing Defects 2 Chamber Macro Defect 3 Chamber Macro Defect Backside Contamination Blocked Etch Macro Defect Poor Rinse – Macro Defect Edge Chips – Macro Defects CMP – Macro Defects Wafer Contamination – Large Wafer Contamination – Small EBR Drip Defect Developer Related Defects Wafer Edge Discoloration Flashfield Defects First 12 Wafers – Different Wafer Hotspot Defects Lens Stepper Macro Defects Missing Patterns Particle Defects Poly Haze Macro Defect Partial Pattern – No Expose Previous Layer Defects Rework – Scrap Avoidance Rework – Yield Improvement Scratches By Human Scratches By Machine Center Spin Macro Defect Spin Defect on Edge Spin Defect – Entire Wafer Spin Defect – Line Reticle Tilt Defect Semiconductor Wafer Inspection ProductsEAGLEview –WheelsMacro Wafer Defect Inspection ProcessGuard – EAGLEview DesktopVendeeMicroSORT – Stand Alone Wafer Sorter MicroINSPECT – Microscope Wafer Inspection MicroINSPECT 300FA – Failure Analysis SITEview Software – Defect Review, Images, and Sorting Customized Solutions HomeCompanyCompany OverviewMicrotronic Innovation HighlightsProductsEAGLEview –WheelsMacro Wafer Defect InspectionMicroSORT – Stand Alone Wafer SorterMicroINSPECT – Microscope Wafer InspectionMicroINSPECT 300FA – Failure AnalysisCustomized SolutionsProcessGuard – EAGLEview Desktop ClientSITEview Software – Defect Review, Images, and SortingTechnologiesApplicationsNewsDefect LibraryPrivacyTerms of UseSite Map © Copyright Microtronic Inc. 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